Study of Reflectivity and Microstructure of Mo/Be Multilayer Mirrors

G. D. Antysheva; Антышева Г. Д.; N. Kumar; Кумар Н.; R. S. Pleshkov; Плешков Р. С.; P. A. Yunin; Юнин П. А.; V. N. Polkovnikov; Полковников В. Н.; N. I. Chkhalo; Чхало Н. И.

doi:10.31857/S1028096023120026

Study of Reflectivity and Microstructure of Mo/Be Multilayer Mirrors

Авторлар: Antysheva G.D.¹^,2, Kumar N.¹, Pleshkov R.S.¹, Yunin P.A.¹^,2, Polkovnikov V.N.¹, Chkhalo N.I.¹
Мекемелер:
1. Institute for Physics of Microstructures RAS
2. Lobachevsky State University of Nizhny Novgorod
Шығарылым: № 12 (2023)
Беттер: 3-6
Бөлім: Articles
URL: https://archivog.com/1028-0960/article/view/664694
DOI: https://doi.org/10.31857/S1028096023120026
EDN: https://elibrary.ru/AXEXHB
ID: 664694

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Аннотация
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Әдебиет тізімі
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Статистика

Аннотация

The reflection coefficient and microstructure of Mo/Be multilayer mirrors were studied as functions of Γ, the ratio of the Mo layer thickness to the period d_p. The thickness and period of the layers were studied using X‑ray diffraction (wavelength 0.154 nm). Clearly defined high-intensity Bragg reflection peaks indicate good reproducibility of layer thicknesses over the depth of the multilayer structure and high quality of interfaces. The reflectivity of the mirror at a wavelength of 11.4 nm was maximum 62% at Γ = 0.42. It sharply decreased at higher and lower values of Γ. Both Mo and Be layers at Γ = 0.42 were polycrystals, which were studied using X-ray diffraction and Raman spectroscopy, respectively. It was also found that the sizes of crystallites almost coincided with the thicknesses of the Be and Mo layers in the period.

Негізгі сөздер

microstructure, Mo/Be multilayer film, reflection coefficient, interface.

Әдебиет тізімі

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