Investigation of the Effect of Defocusing on Interference Patterns Obtained in X-Ray Three-Block Interferometers

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The results of studying the effect of defocusing on interference patterns obtained in X-ray three-block interferometers are presented. Three-block defocused interferometers without a thick block analyzer, with a thick block analyzer and with a separate thick block (enlarger) are designed, manufactured and tested. It is shown that fine structures of interference patterns obtained from three-block defocused interferometers are observed in cases when the interferometer analyzer block is thick or an enlarger is used (fourth thick block). Theoretical calculations show that in the presence of defocusing, as a result of superposition of beams on the input surface of the interferometer analyzer, an interference pattern is formed in the form of parallel fringes (lines) lying in the scattering plane. The coordinates of the maxima of the interference fringes (lines) and the period of the fringes are calculated in the cases without a thick crystal and in its presence, as well as the magnification factor. It has been experimentally proved that a thick crystal (enlarger crystal) does not introduce new information into the interference pattern, but only increases its size in the scattering plane.

Sobre autores

H. Drmeyan

Institute of Applied Problems of Physics NAS of the Republic of Armenia

Autor responsável pela correspondência
Email: drm-henrik@mail.ru
Armênia, Yerevan

M. Vasilyan

Institute of Applied Problems of Physics NAS of the Republic of Armenia

Email: drm-henrik@mail.ru
Rússia, Yerevan

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2. Fig. 1. Defocused three-block L-L-L interferometer and the course of rays in it with illustration of the displacement of superimposed beams on the input surface of the analyzer block: S - splitter block; M - mirror block; A - analyzer; tS, tM, tA - thicknesses of the blocks, respectively; ΔZ - defocus value; θ - Bragg angle

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3. Fig. 2. System consisting of a three-block defocused interferometer with thin and thick blocks

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4. Fig. 3. Distribution of amplitudes in the system shown in Fig. 2

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5. Fig. 4. Defocused three-block interferometer with thin blocks and the course of rays in it (a), as well as the interference pattern obtained from it (b)

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6. Fig. 5. Defocused three-block interferometer with a thick analyzer block (a) and the interference pattern obtained from it (b)

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7. Fig. 6. System consisting of a three-block defocused interferometer with thin blocks and a separate thick block (a) and interference patterns obtained on the photoplate at positions 1 (b) and 2 (c)

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