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Mikroèlektronika
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Keywords Förster effect bipolar transistor diagnostics etching gas temperature ionization kinetics magnetron sputtering mechanism memristor modeling molecular beam epitaxy plasma polymerization powerful LDMOS quantum dot reduced electric field strength resistive switching silicon silicon-on-insulator technology specific power
Current Issue

Vol 54, No 4 (2025)

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Keywords Förster effect bipolar transistor diagnostics etching gas temperature ionization kinetics magnetron sputtering mechanism memristor modeling molecular beam epitaxy plasma polymerization powerful LDMOS quantum dot reduced electric field strength resistive switching silicon silicon-on-insulator technology specific power
Current Issue

Vol 54, No 4 (2025)

Home > Search > Browse Section Index > ЛИТОГРАФИЯ

ЛИТОГРАФИЯ

Issue Title File
Vol 54, No 4 (2025) Perspectives of electron-beam and ion-beam lithography development in Russia PDF
(Rus)
Zaitsev S.I., Irzhak D.V., Il’in A.I., Knyazev M.A., Roshchupkin D.V., Grachev V.P., Kurbatov V.G., Malkov G.V.
Vol 54, No 1 (2025) Investigation of double patterning method with the usage of antispacer PDF
(Rus)
Tikhonova E.D., Gornev E.S.
Vol 53, No 5 (2024) New concept for the development of high-performance X-ray lithography PDF
(Rus)
Chkhalo N.I.
Vol 52, No 5 (2023) Protective Freely Hanging Films for Projection Lithography Installations in the Extreme UV Range PDF
(Rus)
Zuev S.Y., Lopatin A.Y., Luchin V.I., Salashchenko N.N., Tsybin N.N., Chkhalo N.I.
Vol 52, No 2 (2023) Cross Sections of Scattering Processes in Electron-Beam Lithography PDF
(Rus)
Rogozhin A.E., Sidorov F.A.
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