Thermal testing of corundum ceramics: Classical techniques for optical heating

Мұқаба

Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The types of defects and ways of their formation in the production of tiles from corundum ceramics are considered. The integrity of tiles containing artificial defects has been investigated by the method of active thermal non-destructive testing using optical heating. Single- and double-sided thermal control schemes are applied, as well as various methods of software processing of thermograms. It has been established that the best results in detecting internal defects in ceramic tiles with a thickness of 10 mm during thermal stimulation using halogen lamps are obtained by the method of unilateral thermal testing.

Толық мәтін

Рұқсат жабық

Авторлар туралы

S. Chernykh

Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences

Хат алмасуға жауапты Автор.
Email: suo@mail.ru
Ресей, 620108 Yekaterinburg

V. Vavilov

National Research Tomsk Polytechnic University

Email: vavilov@tpu.ru
Ресей, 634028 Tomsk

V. Kostin

Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences

Email: kostin@imp.uran.ru
Ресей, 620108 Yekaterinburg

Yu. Komolikov

Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences

Email: yikom@yandex.ru
Ресей, 620108 Yekaterinburg

D. Kladov

National Research Tomsk Polytechnic University

Email: dyk10@tpu.ru
Ресей, 634028 Tomsk

Әдебиет тізімі

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Қосымша файлдар

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Әрекет
1. JATS XML
Жүктеу
2. Fig. 1. Photo of samples with signatures of internal defects.

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3. Fig. 2. One-sided TC.

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4. Fig. 3. Double-sided TK.

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5. Fig. 4. Initial thermograms and time dependences of the surface temperature of samples 1-4 under unilateral control.

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6. Fig. 5. Examples of thermogram processing with unilateral TC of samples 1-4.

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7. Fig. 6. The initial thermogram and the temperature profile over time with two-sided TC of the defective sample 1 (the term Rect denotes the defective and defect-free rectangular zones selected for analysis).

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8. Fig. 7. The initial thermogram and the temperature profile over time with two-sided TC of the defective sample 2.

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9. Fig. 8. The initial thermogram and the temperature profile over time with two-sided TC of the defective sample 3.

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10. Fig. 9. The initial thermogram and the temperature profile over time with two-sided TC of the defective sample 4.

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11. 10. Processing of experimental data using complex wavelet analysis (second-order Morlaix and Gauss functions).

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