Comparison of methods for changing the spectrum of radiation of a pulse x-ray source to determine the most effective two-energy image processing

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Abstract

For detecting substances with similar chemical composition and density, one of the promising methods of non-destructive testing is dual-energy processing of X-ray images. In particular, dual-energy transformation algorithms can be used to search for minerals hidden within barren rock. This method is most effective when the conditions for registering X-ray images and energy levels are properly selected. This study compares the effectiveness of image processing using the dual-energy method for three cases of spectral composition variation: firstly, as a result of adjusting the voltage on the X-ray tube; secondly, by attenuating low-energy radiation through the use of a copper filter; and thirdly, by combining these two methods. Beryl particles embedded in ground muscovite are used as samples for detection. The study utilizes a pulsed X-ray radiation source that generates radiation pulses of nanosecond duration. An original high-voltage generator scheme has been implemented for the method of regulating radiation energy by changing the peak voltage on the X-ray tube. The use of X-ray sources of this type enables the acquisition of high-resolution X-ray images of moving objects.

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About the authors

A. A. Komarskiy

Institute of Electrophysics of the Ural Branch of the Russian Academy of Sciences

Author for correspondence.
Email: aakomarskiy@gmail.com
Russian Federation, 620110 Yekaterinburg, Amundsen St. 106

S. R. Korzhenevskiy

Institute of Electrophysics of the Ural Branch of the Russian Academy of Sciences

Email: korser1970@yandex.ru
Russian Federation, 620110 Yekaterinburg, Amundsen St. 106

A. V. Ponomarev

Institute of Electrophysics of the Ural Branch of the Russian Academy of Sciences

Email: avponomarev@ya.ru
Russian Federation, 620110 Yekaterinburg, Amundsen St. 106

A. S. Chepusov

Institute of Electrophysics of the Ural Branch of the Russian Academy of Sciences

Email: avponomarev@ya.ru
Russian Federation, 620110 Yekaterinburg, Amundsen St. 106

V. V. Krinitzin

Institute of Electrophysics of the Ural Branch of the Russian Academy of Sciences

Email: avponomarev@ya.ru
Russian Federation, 620110 Yekaterinburg, Amundsen St. 106

O. D. Krasniy

Institute of Electrophysics of the Ural Branch of the Russian Academy of Sciences

Email: avponomarev@ya.ru
Russian Federation, 620110 Yekaterinburg, Amundsen St. 106

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Supplementary files

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2. Figure 1. Structural diagram of the pulsed X-ray source.

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3. Figure 2. Dependence of maximum voltages and currents of the pulsed X-ray tube on the voltage at the primary storage device.

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4. Figure 3. Oscillograms of voltage and current pulses: maximum voltage 145 kV (a); maximum voltage 105 kV (b).

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5. Figure 4. Emission spectra for the pulsed X-ray source at maximum voltage of 145 kV, 105 kV, and at 145 kV using a copper filter.

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6. Figure 5. Photo of beryl particles with rectangular faces.

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7. Figure 6. X-ray images of the study objects obtained at different spectral compositions.

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8. Figure 7. Dual-energy processing when combining pairs of images obtained at different energy spectra of radiation. Beryl particles appear as darker inclusions (there are 3 beryl particles in the images, the largest one has a facet of 5 mm, the particle on the left has a facet of 3 mm, and the particle on top has a facet of 2 mm). In the directions indicated by the arrows, the number is the thickness of the sample (5 and 10 mm); v, h are the vertical and horizontal directions, respectively, along which the intensity distribution of the pixel brightness intensity is obtained in the following.

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9. Figure 8. Pixel intensity profiles of dual-energy images for a 5 mm thick sample, the directions of the distributions are shown by the arrows in Fig. 7 from the top; 2, 3, and 5 mm are the sizes of the particle faces that fell into the distribution profiles.

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10. Figure 9. Pixel intensity profiles of dual-energy images for a 10 mm thick sample, the directions of the distributions are shown by the arrows in Fig. 7 from the bottom; 2, 3, and 5 mm are the sizes of the faces of the beryl particles that fell into the distribution profiles.

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